Design sonsulting, support & optimisation for new & redesigns "Design for testability" (DfT)

• Identify & eliminate design flaws targeting testability & test time

• Improved test point placement

• Integration of new test strategies (JTAG/boundary-scan, cluster tests & functional tests)

• feasibility & realisation of "on-board" chip programming

• Extended contacting possibilities (Fine Pitch, Rigid Pin, Bead Probes,...)

• Component selection

• Validation of designs prior to design freeze